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作 者:Elena N.Velichko Galina L.Klimchitskaya Elina N.Nepomnyashchaya
机构地区:[1]Institute of Physics,Nanotechnology and Telecommunications,Peter the Great St.Petersburg Polytechnic University,St.Petersburg 195251 [2]Department of Astrophysics,Central Astronomical Observatoryat Pulkovo of the Russian Academy of Sciences,St.Petersburg 196140
出 处:《Journal of Electronic Science and Technology》2020年第1期76-82,共7页电子科技学刊(英文版)
摘 要:Some of the modern electronic and optoelectronic devices exploit ferrofluids contained in narrow gaps between two material plates. When the width of the gap becomes below a micrometer, the boundary plates are subjected to the Casimir force arising from the zero-point and thermal fluctuations of the electromagnetic field. These forces should be taken into account in microdevices with the dimensions decreased to below a micrometer. In this paper, we review recently performed calculations of the attractive Casimir pressure in three-layer systems containing a ferrofluid. We also find the ferrofluidic system where the Casimir pressure is repulsive. This result is obtained in the framework of the fundamental Lifshitz theory of van der Waals and Casimir forces. The conclusion is made that enhanced repulsion due to the presence of a ferrofluid may prevent from sticking of closely spaced elements of a microdevice.
关 键 词:CASIMIR PRESSURE FERROFLUIDS MICRODEVICES REPULSION
分 类 号:TN15[电子电信—物理电子学]
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