IGBT动态测试平台杂散电感提取方法  

Stray Inductance Extraction Method of IGBT Dynamic Test Platform

作　　者：唐新灵 张璧君 张语 林仲康 王亮 潘艳 温家良 TANG Xinling;ZHANG Bijun;ZHANG Yu;LIN Zhongkang;WANG Liang;PAN Yan;WEN Jialiang(State Key Laboratory of Advanced Transmission Technology(Global Electricity Interconnection Research Institute),Changping District,Beijing 102209,China)

机构地区：[1]先进输电技术国家重点实验室(全球能源互联网研究院有限公司),北京市昌平区102209

出　　处：《电网技术》2020年第4期1267-1275,共9页Power System Technology

基　　金：国家重点研发计划(2016YFB0901800);国家电网科技项目(5455GB170009)。

摘　　要：绝缘栅双极型晶体管(insulated gate bipolar transistor,IGBT)动态测试平台的杂散电感对IGBT器件动态参数测试结果有很大的影响。提出采用积分法计算测试平台回路杂散电感,可以提高计算结果的准确性。首先,分析了IGBT动态测试平台杂散电感分布特点,建立了等效电路模型。其次,分析了IGBT开关瞬态过程中的波形特点以及续流二极管(free-wheeling diode,FWD)反向恢复与正向恢复特性;提出开通波形相对于关断波形更有利于计算杂散电感。最后,建立了仿真电路模型与试验测试平台,仿真分析结果与试验测试结果相吻合,验证了分析的正确性。所提方法为IGBT动态测试平台杂散电感提取提供了一种简便而准确的计算方法。Stray inductance of IGBT(insulated gate bipolar transistor, IGBT) test platform affects greatly on the dynamic test results of the IGBT devices. An integral method is proposed in this paper to extract the stray inductance of the test platform to improve the accuracy of the calculation results. First, the stray inductance characteristics are analyzed, and an equivalent circuit is built. Then, the switching waveforms of IGBT and the forward and backward recovery of FWD(Free-Wheeling Diode) are analyzed in detail. And the idea is proposed that the opened waveform is more useful to the calculation of stray inductance compared with the shut-off waveform. Last, with a simulation circuit model and an experimental test platform the results of the simulation analysis agrees very well with the experimental test results, which verifies the above analysis. The proposed method in this paper provides a simple and accurate method for the stray inductance extraction of IGBT dynamic test platform.

关 键 词：IGBT 测试平台 杂散电感 电流变化率 

分 类 号：TM721[电气工程—电力系统及自动化]