InSb多元探测器玻璃杜瓦贮存寿命研究  

Study on the Storage Lifetime of Glass Dewar in InSb Multi-Element Detector

作　　者：王洋 张宏飞 孟超[1] 司俊杰[1] Wang Yang;Zhang Hongfei;Meng Chao;Si Junjie(China Airborne Missile Academy,Luoyang 471009,China;Military Representative Office of Army Aviation in Luoyang,Luoyang 471009,China)

机构地区：[1]中国空空导弹研究院,河南洛阳471009 [2]陆航驻洛阳地区军代室,河南洛阳471009

出　　处：《航空兵器》2020年第2期92-96,共5页Aero Weaponry

基　　金：国家自然科学基金项目(YGZJJ02)。

摘　　要：InSb红外探测器是红外系统的核心部件,探测器的寿命在很大程度上决定着系统的寿命,直接影响着系统的使用及保障。因此,探测器的寿命如何评价及采用何种试验方法来评价至关重要,但由于红外系统的敏感性,可查阅的国外资料比较少,并且寿命试验周期长、费用高,国内至今未形成有效的寿命试验、分析与评价方法。本文采用15个InSb多元探测器开展了贮存试验研究,应力水平分别为70℃、80℃、90℃。测试试验过程中不同温度下热负载的变化,对试验数据进行统计分析及处理,获得了寿命加速模型t=2.18×10^-8·exp(0.79/KT),激活能为0.79 eV,评估了探测器在30℃下寿命可以达到30.76年。InSb infrared detectors are the key components of an infrared system,and the lifetime of detector determins the lifetime of a system greatly and affect the application of the system directly,so it is very important how to evaluate the detector life and what kind of test method to be used.Due to sensitiveness of the infrared system,few materials can be consulted,and long cycle and high cost of lifetime experiment,there is not any effective lifetime test,and analysis&evaluation method.In this paper,a storage-lifetime experiment is tested with 15 InSb multi-element detectors,and selected temperatures is 70℃,80℃,and 90℃respectively.The changing of thermal load is tested under different temperatures,and the testing results are statistical analyzed and processed.The accelerated lifetime model t=2.18×10^-8.exp(0.79/KT)is obtained,and the activation energy is 0.79 eV.The lifetime of the detector under 30℃is evaluated up to 30.76 years.

关 键 词：探测器 INSB 寿命试验 贮存寿命 玻璃杜瓦 

分 类 号：TN215[电子电信—物理电子学] TJ760.7[兵器科学与技术—武器系统与运用工程]