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作 者:赖凡[1] 徐梓丞 戴永红[1] LAI Fan;XU Zicheng;DAI Yonghong(The24th Research Institute of China Electronics Technology Group Corporation,Chongqing 400060,P.R.China;Glasgow College,Univ.of Elec.Sci.andTechnol.of China,Chengdu 611731,P.R.China)
机构地区:[1]中国电子科技集团公司第二十四研究所,重庆400060 [2]电子科技大学格拉斯哥学院,成都611731
出 处:《微电子学》2020年第2期202-206,共5页Microelectronics
摘 要:A/D转换器(ADC)的校准技术是提高高性能ADC转换精度的必要手段,它分为模拟校准技术和数字校准技术。数字校准技术较之模拟校准技术更为有效和更具灵活性。数字校准技术是在数字域进行错误代码计算,减轻了对模拟电路的精度要求。在主流制造工艺小尺寸化的趋势之下,许多创新的校准技术得到发展,并广泛应用于包括射频直接采样ADC在内的高速高精度ADC中。本文在分析最新的高速高精度ADC中采用的主要校准技术的基础上,重点研究了几种高采样率高精度ADC所采用的校准技术,侧重分析了数字校准技术。The A/D converters’(ADC) calibration technology was a necessary means to improve the accuracy of the A/D conversion, and it could be divided into analog calibration and digital calibration. Digital calibration technologies were more effective and flexible than analog calibration technologies. In digital calibration, the error code calculation was performed in the digital domain, so the accuracy requirements of analog circuits were alleviated. Under the trend of small size of mainstream manufacturing process, many innovative calibration techniques had been developed and widely used in the research of high speed, high precision ADCs, including radio frequency direct sampling ADCs were analyzed. Based on the analysis and research of the main calibration techniques used in the research of high speed and high precision ADCs in recent years, several high sampling rate and high precision ADCs were analyzed, and digital calibration technologies were emphasized.
关 键 词:A/D转换器 模拟校准 数字校准 时间交织 单通道校准 通道间校准
分 类 号:TN792[电子电信—电路与系统]
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