基于RTDS-GTNET的智能电子装置测试技术  

A Test Technology for Intelligent Electronic Devices Based on RTDS-GTNET

作　　者：杨洪涛 杨洪清 杨佳 李卫良 徐智晶 蔡小辰 YANG Hongtao;YANG Hongqing;YANG Jia;LI Weiliang;XU Zhijing;CAI Xiaochen(Nari Group Corporation,Jiangsu Nanjing 210000,China;Xiangyang Chengzhi Electric Power Design Co.,Ltd.,Hubei Xiangyang 441000,China)

机构地区：[1]南京南瑞集团有限公司,江苏南京210000 [2]襄阳诚智电力设计有限公司,湖北襄阳441000

出　　处：《广西电力》2020年第2期1-8,共8页Guangxi Electric Power

摘　　要：RTDS和智能电子装置(Intelligent Electronic Device,IED)之间互连互通存在复杂、耗时、易出错、测试效率低等问题,为了提高IED的测试效率,本文提出了一种基于RTDS-GTNET的测试配置方法。首先介绍了基于RTDS的IED测试原理;然后描述了RTDS和被测IED之间通过SV报文和GOOSE报文实现互通的原理,及使用配置工具进行RTDS和被测IED之间互通配置的方法及配置过程;接着分析了GTNET板卡的ICD模型文件与国内规范存在的不同之处;最后以T接线路保护IED测试为例,利用RTDS-GTNET板卡构建了实时的闭环测试系统并对该IED进行了测试,分析了测试时GTNET板卡的分配、物理接线及其与被测IED的互通配置过程。研究结果表明,使用本文提出的方法进行GTNET与被测IED之间的互通连接,操作方便,提高了IED的测试效率。Aimed at solving the problems of being complex,time-consuming and error-prone,as well as low test efficiency,of the interconnection and intercommunication between RTDS and Intelligent Electronic Device(IED),in order to improve the test efficiency of the IED,a test configuration method based on RTDS-GTNET is proposed in this paper.Firstly,the principle of IED test based on RTDS is introduced.Then,the intercommunication principle between RTDS and the IED under test through SV messages and GOOSE messages,together with the method and process to configure the intercommunication between RTDS and the tested IED using the configuration tool,are described.The difference between the ICD model file of the GTNET board and the domestic specifications is analyzed.Finally,the IED test of T-type line protection is taken as an example,a real-time closed-loop test system of which is built by using the RTDS-GTNET board.The process of the distribution,physical connection and intercommunication configuration of the GTNET boards during the test is analyzed.The research results show that the intercommunication connection between GTNET and the IED under test which uses the method proposed in this paper is easy to operate and improves the test efficiency of the IED.

关 键 词：智能电子装置 实时数字仿真系统 闭环测试 RTDS 

分 类 号：TM63[电气工程—电力系统及自动化]