裂隙灯显微镜校准方法的研究  

Research on the Calibration Method of Slit-lamp Microscopes

作　　者：丁斌 张成 DING Bin;ZHANG Cheng

机构地区：[1]南通市计量检定测试所,江苏南通226011

出　　处：《计量与测试技术》2020年第5期86-89,共4页Metrology & Measurement Technique

摘　　要：本文介绍了基于放大率和分辨率测定校准裂隙灯显微镜的方法,在对总放大率误差、左右放大率相对误差校准的基础上,对影响裂隙灯显微镜成像质量的分辨率和裂隙像尺寸进行校准,建立了可溯源到国家长度基准的裂隙灯显微镜的校准装置,分析了上级定标和自身装置的不确定度来源。该装置的测量结果的相对扩展不确定度为1. 7%,基本满足目前裂隙灯显微镜的校准要求。This paper introduces the method of calibrating slit-lamp microscopes based on the measurement of magnification and resolution.Based on the calibration of the total magnification deviation and the relative deviation of left and right magnification,the resolution and the size of slit image which influence the imaging quality of slit lamp microscope are calibrated.Calibration device of slit-lamp microscopes,which can trace to national length standard,is established.The uncertainty sources of upper calibration and self-equipment are analyzed.The relative expanded uncertainty of the measurement result is 1.7%.It basically meets the current slit-lamp microscope calibration requirements.

关 键 词：裂隙灯显微镜 总放大率测定仪 光学分辨率板 不确定度 计量 

分 类 号：TG115[金属学及工艺—物理冶金]