基于PXI某处理器模块ATE设备的设计与实现  

Design and Realization of Processor Module ATE Based on PXI Platform

作　　者：曹兴冈[1] 赵斌 Xinggang;Zhao Bin(Aeronautics Computing Technique Institute,Xi'an710068,China)

机构地区：[1]中国航空计算技术研究所,西安710068

出　　处：《计算机测量与控制》2020年第5期252-257,共6页Computer Measurement &Control

基　　金：航空基金项目(2006ZC31002)。

摘　　要：随着测试技术的飞速发展,高性能、高性价比的PXI测试技术平台应运而生,为了提升产品自动化测试效率,将其应用于处理器模块综合自动测试设备(ATE)的软、硬系统结构设计,其采用模块化、标准化思想,以PXI测试技术标准平台为核心,系统软件配合各硬件模块和信号接口模块,既可以某个参数单项测试,也可全项目参数测试,测试覆盖率95%以上,测试完成按照定义格式系统自动存储测试结果;被测试产品功能、性能正常,投入使用效果良好,并为PXI测试平台应用于ATE设备提供应用实践平台,具有普遍的通用性及广泛的推广性。With the rapid development of test technology,high performance and cost-effective PXI test platform came into being.To improve the efficiency of automated product testing,apply it to the soft and hard system structure design of a processor module integrated automatic test equipment(ATE).It adopts modular and standardized ideas,and takes the PXI test technology standard platform as the core.System software cooperating with each hardware module and signal interface module,can't only test a single parameter but also all parameters of a project,and more than the test coverage rate of 95%.After the test is completed,the system automatically stores the test structure according to the defind format.As a result the function and performance of the tested product are normal,and the effect of putting into use is good.It will provide an practice chance for the application of PXI test platforms into ATE,which has general universality and extensive promotion.

关 键 词：PXI平台 ATE设计 计量校准 

分 类 号：V271[航空宇航科学与技术—飞行器设计]