一种优化寄存器默认值的掩膜后ECO方法  

A Post-mask ECO Method for Optimizing Register Default Value

作　　者：王秋实 韩琼磊[1,2] WANG Qiu-shi;HAN Qiong-lei(Anhui Siliepoch Technology Co.,Ltd.,Hefei 230031,China;No.38th Research Institute,China Electronic Technology Group Corporation,Hefei 230031,China)

机构地区：[1]安徽芯纪元科技有限公司,安徽合肥230031 [2]中国电子科技集团公司第38研究所,安徽合肥230031

出　　处：《中国集成电路》2020年第5期46-49,93,共5页China lntegrated Circuit

摘　　要：芯片在通过多目标晶圆(Multi Project Wafer,MPW)得到的样片进行测试后,可能会发现芯片内部部分寄存器上电复位后的默认值不合理,需要进行优化。本文提出了一种优化寄存器默认值的掩膜后工程改变命令(Engineering Change Order,ECO)方法,其特点是只修改金属层掩膜板即可实现寄存器默认值的优化,减少芯片进行工程批流片的成本。我们利用全局控制寄存器模块进行试验评估,最后的仿真结果和签核验证表明ECO后的寄存器默认值满足修改要求。After testing the MPW shuttle chips,we may find that the default values of some internal registers after power-on reset are not reasonable and need to be optimized.This paper proposes a post-mask ECO method for optimizing the default value of register,by only modifying the metal layer masks,which reduces the cost of chip engineering tape out.The proposed method has been verified by the global control register module and the final simulation results show that this ECO method can meet the requirements.

关 键 词：寄存器 默认值 工程改变命令 掩膜后 

分 类 号：TP332.11[自动化与计算机技术—计算机系统结构] TN40[自动化与计算机技术—计算机科学与技术]