TXRF与EDXRF分析方法对比研究  

Comparison of TXRF and EDXRF Analysis Methods

作　　者：刘伊初 赵婷伟 邓玉福 孟德川[1,2] 于桂英 LIU Yi-chu;ZHAO Ting-wei;DENG Yu-fu;MENG De-chuan;YU Gui-ying(College of Physical Science and Technology,Shenyang Normal University,Liaoning Shenyang 110034,China;Ray Instrumentation Engineering Technology Research Center of Liaoning Province,Liaoning Shenyang 110034,China;Experimental Teaching Center,Shenyang Normal University,Liaoning Shenyang 110034,China)

机构地区：[1]沈阳师范大学物理科学与技术学院,辽宁沈阳110034 [2]辽宁省射线仪器仪表工程技术研究中心,辽宁沈阳110034 [3]沈阳师范大学实验教学中心,辽宁沈阳110034

出　　处：《辽宁化工》2020年第4期360-363,共4页Liaoning Chemical Industry

摘　　要：X射线荧光光谱分析法广泛应用于物质成分的定性与定量分析。全反射X射线荧光分析法(TXRF)是在能量色散X射线荧光分析(EDXRF)原理的基础上,加入X射线的全反射技术形成的一种新的表面痕量分析方法。本文从原理、仪器装置及定量定性分析过程等方面,对EDXRF和TXRF进行了对比分析研究。作为一种新的X射线荧光分析方法,TXRF具有灵敏度高、检出限低等特点,同其他检测方法相比,在很多应用领域都显示出很好的优越性。X-ray fluorescence analysis was widely applied in the qualitative and quantitative analysis of material composition.Total reflection X-ray fluorescence analysis(TXRF)was a new surface trace analysis method based on the principle of energy dispersive X-ray fluorescence analysis(EDXRF).In this paper,EDXRF and TXRF were compared from the aspects of principle,instrumentation,quantitative analysis process and qualitative analysis process.As a new X-ray fluorescence analysis method,TXRF has the characteristics of high sensitivity,low detection limit and so on.Compared with other detection methods,TXRF has shown good advantages in many application areas.

关 键 词：TXRF EDXRF 分析方法 

分 类 号：TQ016.51[化学工程]