Investigations on the Effect of Electrical Contact Degradation on High Speed Wide-Band Signal Integrity  

作　　者：WANG Ziren GAO Jinchun JI Rui BILAL Hafiz Muhammad 

机构地区：[1]Beijing Key Laboratory of Work Safety Intelligent Monitoring,School of Electronic Engineering,Beijing University of Posts and Telecommunications,Beijing 100876,China [2]China Academy of Information and Communication Technology,Beijing 100191,China

出　　处：《Chinese Journal of Electronics》2020年第3期525-532,共8页电子学报（英文版）

基　　金：This work was supported by the National Natural Science Foundation of China(No.51877010);Open Fund of State Key Laboratory of Information Photonics and Optical Communications(BUPT);the BUPT Excellent Ph.D.Students Foundation(No.CX2019121);the Fundamental Research Funds for the Central Universities,BUPT(No.2019PTB-014).

摘　　要：Electrical contact degradation will affect the signal integrity resulting in poor communication performance.In the present work,the effect of electrical contact degradation on wide-band digital signal integrity was studied using both the theoretical analysis and experimental testing.The characteristics of digital signals with rise times of 200 ps,400 ps,600 ps and 800 ps through connectors with different degradation levels were studied.The maximum bandwidth of these signals can reach up to 1.75 GHz.An equivalent model of the connector with degraded contact surface was developed and the experimental results are consistent with the model results approximately.The influence of capacitance characteristics caused by degraded contact surface on digital signal waveform was calculated and analyzed.The results of this paper are helpful in developing a better understanding of the characteristics of wide-band digital signal waveforms through the degraded contact surface and provide a theoretical support to identify failure features in fault diagnosis.

关 键 词：Contact degradation Signal integrity High speed wideband signal Capacitive coupling 

分 类 号：TN911.7[电子电信—通信与信息系统]