掠入射X射线显微镜系统光线追迹程序  被引量:5

Ray-Tracing Program for Grazing Incident X-Ray Microscope System

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作  者:赵玲玲 孙德林 王丽丽 王刚 Zhao Lingling;Sun Delin;Wang Lili;Wang Gang(Key Laboratory of Cyber-Physical System and Intelligent Control in Universities of Shandong,School of Information and Electrical Engineering,Ludong University,Yantai,Shandong 204625,China)

机构地区:[1]鲁东大学信息与电气工程学院山东省高校信息物理融合与智能控制重点实验室,山东烟台204625

出  处:《中国激光》2020年第4期27-33,共7页Chinese Journal of Lasers

摘  要:将掠入射改进的Kirkpatrick-Baez(KBA)型X射线显微镜用于研究激光等离子体惯性约束聚变,它由两对正交的反射镜构成。研究了针对掠入射反射系统的光线追迹程序,利用该程序设计了KBA反射镜,得出对于这种双反射镜结构,孔径光阑放在第二块反射镜上结构更紧凑的结论。研究了KBA显微镜的场曲以及俯仰角对成像质量的影响,找出了最优的离焦距离,制定了系统的俯仰角误差。In this study,a Kirkpatrick-Baez(KBA)X-ray microscope is developed to diagnose laser-produced plasmas and research the inertial confinement fusion.The microscope comprises two sets of bimirrors.Herein,the ray-tracing program for grazing incident reflectors is studied.The KBA reflector is designed by using this program.It is found that the bimirror would be compact if the aperture stop is placed on the second mirror.Furthermore,the influences of field curvature and pitch angle of KBA microscope on the image quality are studied,and the optimal defocusing distance and the pitch angle error of the system are determined.

关 键 词:激光光学 掠入射 Kirkpatrick-Baez X射线显微镜 光线追迹 

分 类 号:O434.1[机械工程—光学工程]

 

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