一种基于JTAG协议的SiP测试方法  

A SiP Test Method Based on JTAG Protocol

作　　者：王圣辉 陆锋[1,2] 苏洋[2] 张凯红[2] WANG Shenghui;LU Feng;SU Yang;ZHANG Kaihong(College of Insternet of Things, Jiangnan University, Wuxi 214122, China;China Electronics Technology Corporation No.58 Research Institute, Wuxi 214035, China)

机构地区：[1]江南大学物联网工程学院,江苏无锡214122 [2]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《测试技术学报》2020年第3期252-256,共5页Journal of Test and Measurement Technology

摘　　要：介绍了一种基于JTAG测试技术的系统化SiP测试方法.针对SiP的设计要求、测试需求、测试流程和测试评价指标4个方面,提供一套完整的SiP测试解决方案.实验表明,运用JTAG测试技术对信号处理SiP电路进行互连测试,可以精准地测试和定位出电路内部的异常和故障,有效提升了SiP系统内封装模块对外测试的透明度,降低了测试的黑盒效应.This paper introduces a systematic SiP testing method based on JTAG testing technology.According to the design requirements,test requirements,test process and test evaluation index of SiP,a complete set of SiP test solutions is provided.Experiments show that using JTAG test technology to test the interconnection of signal processing SiP circuits can accurately test and locate the abnormalities and faults inside the circuits,which effectively improves the transparency of external testing of the package modules in SiP systems,and reduces the black box effect of testing.

关 键 词：JTAG 边界扫描 互连测试 SiP测试 

分 类 号：TN791[电子电信—电路与系统]