存储测试硬回收装置双层灌封结构冲击防护效能分析  

Analysis of the impact protection efficiency of the double-layer damping structure of the storage and test hardware recovery device

作　　者：王飞[1] 邓志方[1] 吴自佳 乔刚[1] 张成[1] Wang Fei;Deng Zhifang;Wu Zijia;Qiao Gang;Zhang Cheng(Institute of Systems Engineering,CAEP,Mianyang Sichuan,621999)

机构地区：[1]中国工程物理研究院总体工程研究所,四川绵阳621999

出　　处：《电子测试》2020年第12期5-8,共4页Electronic Test

基　　金：国防技术基础科研项目(182ZW31004)资助。

摘　　要：存储测试技术是获取装备产品飞行试验、安全性试验测试数据的重要手段。抗高冲击存储测试硬回收装置一般采用多层缓冲设计,为研究多层缓冲设计的防护效能,开展了多层防护结构与单层防护结构的过载及变形缓冲试验对比,结果表明,在相同外形尺寸约束条件下,多层防护结构可以显著降低过载峰值50%,核心器件上峰值应变可以降低20%-30%,防护效能明显。Storage test technology is an important means to obtain the flight test and safety test data of equipment products.In order to study the protection efficiency of the multi-layer buffer design,a comparison between the multi-layer protection structure and the single-layer protection structure is carried out.The results show that the multi-layer protection structure can significantly reduce the overload peak value by 50%and the peak strain on the core device can be reduced under the same shape and size constraints It is 20%-30%lower,and the protection efficiency is obvious.

关 键 词：存储测试 硬回收 多层结构 冲击防护 

分 类 号：V216[航空宇航科学与技术—航空宇航推进理论与工程]