基于区域生长法的QFP芯片引脚缺陷检测算法  

Algorithm Based on Regional Growth Method for QFP Chip Pin Defects Detection

作　　者：陈广锋[1] 王琳霞 席伟 周敏飞 CHEN Guangfeng;WANG Linxia;XI Wei;ZHOU Minfei(College of Mechanical Engineering,Donghua University,Shanghai 201620,China)

机构地区：[1]东华大学机械工程学院,上海201620

出　　处：《东华大学学报（自然科学版）》2020年第3期401-407,共7页Journal of Donghua University(Natural Science)

基　　金：国家自然科学基金资助项目(51375084);中央高校基本科研业务费专项资金资助项目(16D110308)。

摘　　要：为降低贴片机的废品率,提出了基于机器视觉的小型方块平面封装(quad flat package,QFP)芯片引脚缺陷检测算法,以在贴装前对芯片的引脚进行质量检测。利用区域生长法获取引脚的总数及各个引脚主体部分的形心坐标及面积。通过与实际引脚总数进行对比,判断是否存在引脚缺失的缺陷,并和实际引脚的间距、面积的设定值进行对比,当测定值超过设定值一定范围时,认为该芯片存在引脚位置偏移以及高度偏移等缺陷,从而吸取新的芯片进行判断,实现持续自动的测试。测试结果表明,该方法具有检测速度快、误检率低的优点,可以较好地满足生产工艺要求。In order to reduce the rejection rate of mounter,this paper proposed a detection algorithm based on machine vision for QFP(quad flat package)chip pin defects.The quality of chip s pins were detected before placement.The total number of pins and the centroid coordinates as well as area of main parts of pins were obtained by the regional growth method.The defects of pins were judged by comparing the total number with the actual amount.The setting value of actual spacing and area were compared,and it could be considered that there were some defects in chip such as pin position and height offset when the set value exceeded a certain range.Then a new chip was absorbed to judge and a continuous automatic test was achieved.The test results show that the method has the advantages of high speed and low false detection rate,which can meet the requirements of production.

关 键 词：机器视觉 引脚缺陷检测 区域生长法 贴片机 QFP芯片 

分 类 号：TP751.1[自动化与计算机技术—检测技术与自动化装置]