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作 者:Yan-Bin Sheng Hong-Peng Zhang Tie-Long Shen Kong-Fang Wei Long Kang Rui Liu Tong-Min Zhang Bing-Sheng Li 盛彦斌;张宏鹏;申铁龙;魏孔芳;康龙;刘瑞;张桐民;李炳生(Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000;Key Laboratory of Materials Physics,Institute of Solid State Physics,Chinese Academy of Sciences,Hefei 230031;State Key Laboratory for Environment-Friendly Energy Materials,Southwest University of Science and Technology,Mianyang 621010)
机构地区:[1]Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000 [2]Key Laboratory of Materials Physics,Institute of Solid State Physics,Chinese Academy of Sciences,Hefei 230031 [3]State Key Laboratory for Environment-Friendlv Energy AIaterials,Southwest University of Science and Technology,Mianyang 621010
出 处:《Chinese Physics Letters》2020年第3期36-40,共5页中国物理快报(英文版)
基 金:Supported by the National Natural Science Foundation of China(Grant No.U1832133)。
摘 要:Bulk Cu/V multilayers simultaneously possess high strength and excellent radiation resistance thanks to their high density of interfaces.Irradiation-induced atomic mixing of Cu/V multilayers has been less investigated.Here,we investigate the ion irradiation of bulk Cu/V multilayers exposed to H2^+ or He^+ ions at 350℃.The microstructure and elemental distribution are investigated by transmission electron microscopy and energy dispersive x-ray spectroscopy.Facetted bubbles and atomic mixing are observed after ion irradiation.The possible mechanisms of irradiation-induced atomic mixing are discussed.
关 键 词:spectroscopy. MICROSTRUCTURE RESISTANCE
分 类 号:TL34[核科学技术—核技术及应用]
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