Scanning-Position Error-Correction Algorithm in Dual-Wavelength Ptychographic Microscopy  

作　　者：Rui Ma Shu-Yuan Zhang Tian-Hao Ruan Ye Tao Hua-Ying Wang Yi-Shi Shi 马锐;张书源;阮天昊;陶冶;王华英;史祎诗(School of Optoelectronics,University of Chinese Academy of Sciences,Beijing 100049;Center for Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049;College of Mathematics and Physics,Hebei University of Engineering,Handan 056038)

机构地区：[1]School of Optoelectronics,University of Chinese Academy of Sciences,Beijing 100049 [2]Center for Materials Science and Optoelectronics Engineering,University of Chinese Academy of Sciences,Beijing 100049 [3]College of Mathematics and Physics,Hebei University of Engineering,Handan 056038

出　　处：《Chinese Physics Letters》2020年第4期41-45,共5页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant No. 61575197;the Fusion Foundation of Research and Education of CAS;the Youth Innovation Promotion Association of CAS (2017489);the University of Chinese Academy of Sciences;the Natural Science Foundation of Hebei Province of China (F2018402285)

摘　　要：We propose a new algorithm for the error correction of scanning positions in ptychographic microscopy.Since the scanning positions are varied mechanically by moving the illuminating probes laterally,the scanning errors will accumulate at multiple positions,greatly reducing the reconstruction quality of a sample.To correct the scanning errors,we use the correlation analysis for the diffractive data combining with the additional constraint of dual wavelengths.This significantly improves the quality of ptychographic microscopy.Optical experiments verify the proposed algorithm for two samples including a resolution target and a fibroblast.

关 键 词：Dual POSITIONS CORRECTION 

分 类 号：TH742[机械工程—光学工程]