Effect of Zr Content on Formation and Optical Properties of the Layered PbZrxTi1-xO3 Films  

作　　者：Yang-Yang Xu Yu Wang Ai-Yun Liu Wang-Zhou Shi Gu-Jin Hu Shi-Min Li Hui-Yong Deng Ning Dai 许阳阳;王宇;刘爱云;石旺舟;胡古今;李世民;邓惠勇;戴宁(Department of Physics,College of Mathematics and Science,Shanghai Normal University,Shanghai 200234;National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083)

机构地区：[1]Department of Physics,College of Mathematics and Science,Shanghai Normal University,Shanghai 200234 [2]National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083

出　　处：《Chinese Physics Letters》2020年第2期43-46,共4页中国物理快报（英文版）

基　　金：the Frontier Science Research Project of Chinese Academy of Sciences(No.QYZDJ-SSW-SLH018);the National Natural Science Foundation of China(Nos.11174307 and 11933006);the National Key Basic Research Program of China(No.2016YFB0402405).

摘　　要：PbZrxTi1-xO3(PZT)fims are fabricated on F-doped tin oxide(FTO)substrates using chemical solutions containing PVP polymer and rapid thermal annealing processing.The dependence of the layered PZT multilayer formation and their optical properties on the Zr content x are examined.It is found that all the PZT films are crystallized and exhibit 110-preferred orientation.When x varies in the region of 0-0.8,the PZT films display lamellar structures,and a high reflection band occurs in each optical reflectance spectrum curve.Especially,those PZT fikms with Zr/Ti atomic ratio of 35/65-65/35 show clearly layered cross-sectional morphologies arranged alternatively by porous and dense PZT layers,and have a peak optical reflectivity of>70%and a band width of>45 nm.To obtain the optimal Bragg reflection performance of the PZT multilayers,the Zr content should be selected in the range of 0.35-0.65.

关 键 词：sectional REFLECTIVITY FILMS 

分 类 号：TM221[一般工业技术—材料科学与工程] TB383.2[电气工程—电工理论与新技术]