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作 者:张庆祥[1] 于登云[2] 李衍存[1] 贾晓宇[1] 王颖[1] 郑玉展[1] 郭刚[3] 丁李利 ZHANG Qingxiang;YU Dengyun;LI Yancun;JIA Xiaoyu;WANG Ying;ZHENG Yuzhan;GUO Gang;DING Lili(Beijing Institute of Spacecraft System Engineering,Beijing,100094,China;China Aerospace Science and Technology,Beijing 100048,China;China Institute of Atomic Energy,Beijing 102413,China;Northwest Institute of Nuclear Technology,Xi'an 710024,China)
机构地区:[1]北京空间飞行器总体设计部,北京100094 [2]中国航天科技集团公司,北京100048 [3]中国原子能科学研究院,北京102413 [4]西北核技术研究院,西安710024
出 处:《航天器环境工程》2020年第3期293-298,共6页Spacecraft Environment Engineering
基 金:国家自然科学基金项目(编号:11675013)。
摘 要:针对基于SRAM型FPGA实现的系统的单粒子效应敏感度评估,采用北京放射性核束装置CYCIAE-100回旋加速器提供的中能质子进行辐照试验研究。以典型SRAM型FPGA器件XC4VSX55为试验样品,获得其本征单粒子翻转截面以及特定应用下的翻转位数与功能错误数的比例关系;并将结果与在瑞士PSI质子辐照装置获得的试验结果进行比较。此外,提出针对基于SRAM型FPGA实现的系统的两步骤单粒子翻转敏感度评估方法,可以定量评估器件在轨功能错误数。本工作同时表明CYCIAE-100提供的长射程的质子,对于倒装器件的单粒子翻转敏感度评估具有重要价值。This paper makes the single event sensitivity evaluation of SRAM-based FPGA designs by using the medium-energy protons accelerated by the CYCIAE-100 cyclotron,Beijing Radioactive Ion-beam Facility.The device(DUT)is a typical SRAM based FPGA(Field-Programmable Gate Array).The intrinsic SEU cross sections are obtained,and the ratio of the upsets to the function errors for a certain application are compared with those acquired by using the proton irradiation facility of Paul Scherrer Institut(PSI),Switzerland.A two-stage method for the single event sensitivity evaluation is proposed for FPGA applications,by which the functional errors in orbit can be estimated.The CYCIAE-100 can provide long-range high-energy protons and will play an important role in the single event sensitivity evaluation especially for flip-chip packaged devices.
关 键 词:中能质子 单粒子敏感度评估 CYCIAE-100回旋加速器 试验研究
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