镜面反射综合孔径成像方法研究  

Research on Mirror Reflection Synthetic Aperture Imaging

作　　者：闫兴伟[1] 魏志强[1] 李春化[1] YAN Xing-wei;WEI Zhi-qiang;LI Chun-hua(Xi'an Electronic Engineering Research Institute,Xi'an 710100,China)

机构地区：[1]西安电子工程研究所,西安710100

出　　处：《微波学报》2020年第3期44-48,共5页Journal of Microwaves

基　　金：国防科技创新特区项目(17-H863-02-ZT-004-036-01)。

摘　　要：常规的综合孔径成像方法需要进行相干探测,阵列单元为结构复杂的超外差结构,随着成像频率的增加,其研制难度和性能要求将限制综合孔径成像技术在高频段的发展。文章提出的镜面反射综合孔径成像方法采用非相干探测方法,通过探测器阵列或单元扫描对目标场景进行幅度(功率)探测即可获得可视度函数,然后通过成像反演方法获得场景的亮温图像。镜面反射综合孔径成像方法使用的非相干探测单元结构简单,实现难度低,可避免在高频段实现综合孔径成像的难点。镜面反射综合孔径成像方法相比常规综合孔径成像方法实现相同的成像结果可节约一半的天线阵列孔径,并且最少只需一个阵列单元即可实现综合孔径成像。通过理论分析、仿真计算和点目标源成像实验对镜面反射综合孔径成像技术进行了研究。镜面反射综合孔径成像技术为实现综合孔径成像技术提供了一种新途径。Since the traditional synthetic aperture imaging requires coherent detection,the array element is a complex superheterodyne structure,with the increase of imaging frequency,the development difficulty and performance requirements will limit the development of synthetic aperture imaging technology in high frequency band.The mirror reflection synthetic aperture imaging proposed in this paper uses incoherent detection method,the visibility function can be obtained by detecting the amplitude(power)of the target scene radiation through detector array or element scanning,and then the scene bright temperature image can be reconstructed by imaging inversion method.The structure of incoherent detector is simple and easy to realize,therefore,the difficulty of realizing synthetic aperture imaging in high frequency band can be avoided.Mirror reflection synthetic aperture imaging can obtain the same imaging results with half of the antenna array aperture compared with traditional synthetic aperture imaging,and the image can be reconstruct with only one detector.In this paper,mirror reflection synthetic aperture imaging is studied by theoretical analysis,simulation calculation and point target source imaging experiment.Mirror reflection synthetic aperture imaging technology provides a new way to realize synthetic aperture imaging technology.

关 键 词：综合孔径 镜面反射 功率检测 

分 类 号：TN820[电子电信—信息与通信工程] O441.4[理学—电磁学]