电容式触摸屏感应芯片测试方法研究  

Research on test method of capacitive touch screen induction chip

作　　者：高剑[1] 张晨阳 Gao Jian;Zhang Chenyang(Beijing Key Laboratory of Integrated Circuit Testing Technology,Beijing Institute of Automatic lest Technology,Beijing 100088,China)

机构地区：[1]北京自动测试技术研究所集成电路测试技术北京市重点实验室,北京100088

出　　处：《电子测量技术》2020年第5期156-160,共5页Electronic Measurement Technology

摘　　要：电容式触摸屏感应芯片由于具备接触感应特性,难以用自动测试系统直接测试,为此,设计了扩展电路与自动测试系统相结合的方法实现此类芯片测试。通过切换偏置电阻实现了芯片电容敏感度、感应频率及偏置电流的设置,并通过电容继电器矩阵控制调节触点电容,引起芯片输出波形的频率变化,用以高速计数器为核心的频率测量单元测试输出通道频率,从而实现了较完整的直流、交流和功能项的测试。测试实验提示,该方法稳定性好,易于实现模块化,适于并行测试,测试效率较高。Capacitive touch screen sensor chip is difficult to be tested directly with the automatic test system because of its contact sensing characteristics.For this reason,the method of combining the extended circuit with the automatic test system is used.By this method,the chip capacitance sensitivity,induction frequency and bias current are set by switching the bias resistance.The contact capacitance is controlled by the capacitance relay matrix that cause the frequency change of the chip output waveform.The frequency measurement unit with the high-speed counter as the core tests the output channels frequency so as to achieve the complete test of DC,AC and functional items.The test results show that this method is stable,easy to realize modularization,suitable for parallel test,and has high test efficiency.

关 键 词：电容式触摸屏 感应电路 自动测试系统 

分 类 号：TN407[电子电信—微电子学与固体电子学]