基于相变存储器单元的高速电流脉冲测试系统  

High Speed Test System of Current Pulse for Phase Change Memory Devices

作　　者：王玉菡 曾自强 王玉婵[3] WANG Yuhan;ZENG Ziqiang;WNAG Yuchan(School of Electrical and Electronic Engineering,Chongqing University of Technology,Chongqing 400054,China;School of Electronics and Automation,Chongqing Aerospace Polytechnic,Chongqing 400021,China;School of Optoelectronic Engineering,Chongqing University of Posts and Telecommunications,Chongqing 400065,China)

机构地区：[1]重庆理工大学电气与电子工程学院,重庆400054 [2]重庆航天职业技术学院电子工程系,重庆400021 [3]重庆邮电大学光电工程学院,重庆400065

出　　处：《重庆理工大学学报（自然科学）》2020年第6期195-199,共5页Journal of Chongqing University of Technology：Natural Science

基　　金：国家自然科学基金青年科学基金项目(61804020);重庆市教委科学技术研究项目(KJ1709212,KJ1600439);重庆理工大学青年科研项目星火支持计划项目(2014XH10);重庆邮电大学博士启动基金项目(A2015-38);重庆邮电大学自然基金项目(A2015-51)。

摘　　要：相变存储单元的测试平台多为电压测试平台,但是电压操作存在可控性差等问题,直接影响操作过程中的速度和功耗,且芯片中对单元的操作一般为电流操作,基于此,设计搭建了纳秒级电流脉冲测试系统。该系统采用自主研发的高速可编程恒流驱动芯片提供电流脉冲信号,可提供最小宽度为500 ns的电流脉冲信号。利用固定电阻元件对系统进行测试验证,测试结果与理论值基本一致。在此基础上,对相变单元进行测试,得到了完整的测试窗口,且实现了单元测试过程中瞬态电压的提取,进一步验证了系统的可靠性。The test platforms based on phase change memory(PCM)are mostly voltage test platforms.However,there are some problems for voltage operation,such as poor controllability.The problems directly affect the speed and power consumption in the operation process.In addition,the operation of the cells in chip testing is generally current operation.Based on this,a nanosecond current pulse test system is designed and built in this work.The system,which can provide current pulse signal with a minimum width of 500 ns,uses self-developed high-speed programmable constant current driver chip to provide current pulse signal.The reliability of the system has been verified by testing the fixed resistance and PCM cell and analyzing the test results.

关 键 词：相变存储器 电流脉冲 测试系统 可靠性 

分 类 号：TP333[自动化与计算机技术—计算机系统结构]