基于偏振测量的粗糙表面参数反演方法  

Inversion Method of Rough Surface Parameters Based on Polarization Measurement

作　　者：张正林 陈锦成 韩玉阁[1] ZHANG Zheng-lin;CHEN Jin-cheng;HAN Yu-ge(School of Energy and Power Engineering, Nanjing University of Science and Technology, Nanjing 210094, China)

机构地区：[1]南京理工大学能源与动力工程学院,江苏南京210094

出　　处：《红外》2020年第4期20-26,共7页Infrared

摘　　要：材料的复折射率是计算偏振度时不可缺少的物理参数。由于直接测量复折射率较为困难,在现有的粗糙表面偏振双向反射分布函数(polarized Bidirectional Reflectance Distribution Function,pBRDF)的基础上,推导了材料的偏振反射率表达式,提出了入射光线为线性偏振时材料表面参数的反演方法,提高了复折射率计算的适用性。反演结果与文献中参考值的对比表明,该反演方法具有较高的可靠性。The complex refractive index of materials is an indispensable physical parameter for calculating the degree of polarization.Since it is relatively difficult to measure the complex refractive index directly,the polarized reflectivity expression of the materials is derived,and an inversion method of surface parameters is proposed when the incident light is linearly polarized based on the existing polarized bidirectional reflectance distribution function of rough surfaces,which can improve the applicability of the complex refractive index calculation.The comparison between the inversion results and the reference values indicates that the inversion method has good reliability.

关 键 词：偏振 复折射率 偏振反射率 

分 类 号：TN219[电子电信—物理电子学]