Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources  

作　　者：Ruirong Wang Zhiheng Fang Honghai An Jun Xiong Zhiyong Xie Erfu Guo Chen Wang Anle Lei Wei Wang 王瑞荣;方智恒;安红海;熊俊;谢志勇;郭尔夫;王琛;雷安乐;王伟(Shanghai Institute of Laser Plasma,China Academy of Engineering Physics,Shanghai 201899,China;National Laboratory on High Power Lasers and Physics,Shanghai 201899,China)

机构地区：[1]Shanghai Institute of Laser Plasma,China Academy of Engineering Physics,Shanghai 201899,China [2]National Laboratory on High Power Lasers and Physics,Shanghai 201899,China

出　　处：《Chinese Optics Letters》2020年第6期30-33,共4页中国光学快报（英文版）

基　　金：This work was supported by the National Natural Science Foundation of China(No.11575168).

摘　　要：An aberration-free imaging technique was used to design a double-spherically bent crystal spectrometer with high energy and spatial resolutions to ensure that the individual spectral lines are represented as perfectly straight lines on the detector.After obtaining the matched parameters of the two crystals via geometry-based optimization,an alignment method was employed to allow the spacing between the crystals and the detector to be coupled with the source.The working principle of this spectrum-measuring scheme was evaluated using a Cu X-ray tube.High-quality spectra with energy resolutions(E/ΔE)of approximately 3577 were obtained for a relatively large source size.

关 键 词：double-spherically bent crystal aberration-free imaging X-ray spectra 

分 类 号：O433[机械工程—光学工程]