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作 者:陈春梅 王辉[1] 许冰 何子均 庞婷[1] Chen Chun-mei;Wang Hui;Xu Bing;He Zi-jun;Pang Ting(Southwest China Research Institute of Electronic Equipment,Sichuan Chengdu 610036)
机构地区:[1]中国电子科技集团公司第二十九研究所,四川成都610036
出 处:《电子质量》2020年第7期64-68,共5页Electronics Quality
摘 要:宽带微波产品由于集成度大大幅提升,潜在失效模式探测难度增大,返工返修的难度也随之增大,且极易形成整件批量报废。该文通过对某宽带微波产品设计开发过程中涉及到的潜在失效模式进行识别和分析,对风险顺序数高的失效模式采取有效的措施,减少或降低了潜在失效模式发生的概率,提升了产品的可靠性。Due to the great improvement in the degree of broadband microwave products,it is more difficult to detect failure modes,and it is also more difficult to rework and repair,and it is very easy to form batch scrapping of the whole piece.In this paper,through the identification and analysis of the failure modes involved in the design and development of a broadband microwave product,effective measures are taken for the failure modes with high RPN to reduce the probability of failure modes,the reliability of the products is improved.
分 类 号:TN454[电子电信—微电子学与固体电子学]
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