函数级单片机软件测试系统设计  

Design of Subprogram Level MCU Software Test System

作　　者：张伟 王福虎 李彬 张超峰 韩慧 Zhang Wei;Wang Fuhu;Li Bin;Zhang Chaofeng;Han Hui(The 718th Research Institute of CSSC,Handan 056027,China)

机构地区：[1]中国船舶集团有限公司第七一八研究所,邯郸056027

出　　处：《单片机与嵌入式系统应用》2020年第8期80-82,共3页Microcontrollers & Embedded Systems

摘　　要：本文主要解决单片机软件测试过程中单元测试效率低以及功能测试不够灵活的问题。通过LabVIEW软件开发测试程序,在单片机软件中增加测试接口,两者配合就可以实现函数级别的暴力穷举测试,以及支持断点和追踪的功能测试。本文提供了该测试系统的主要设计思路和关键部分的实现步骤,具有一定可行性和先进性。This paper is to solve the problems that the unit test is inefficient and the functional test is dull in the process of MCU software test.By the means of developing test software by LabVIEW and adding on test port to MCU software,the software test system can do subprogram level exhaustion test and do functional test with code breakpoint and tracing.This paper provides the main design ideas and the key implementation steps of this software test system,which is viable and advanced.

关 键 词：单片机 软件测试 LABVIEW 断点 追踪 

分 类 号：TP311.5[自动化与计算机技术—计算机软件与理论]