采用能量色散型X射线衍射测定晶体的结构参量  

Measuring crystal structure parameter based on energy dispersive X-ray diffraction

作　　者：王新[1] 徐捷[1] 穆宝忠[1] WANG Xin;XU Jie;MU Bao-zhong(School of Physics Science and Engineering,Tongji University,Shanghai 200092,China)

机构地区：[1]同济大学物理科学与工程学院,上海200092

出　　处：《物理实验》2020年第7期7-10,共4页Physics Experimentation

基　　金：国家重点研发计划项目资助(No.2017YFA0403302,No.2017YFA0403304)。

摘　　要：针对德拜法、粉末衍射法及衍射仪法等测量耗时长的问题,采用能量色散型X射线衍射测定晶体的结构参量.构建了能量色散型X射线衍射实验系统仿真模型,搭建了实验系统,测量了NaCl和SiO2晶体的结构参量.实测结果与理论值的偏差小于0.3%,测量时间仅1 min.The experimental method for measuring crystal structure parameter based on energy dispersive X-ray diffraction(EDXRD)was adopted due to the long time-consuming Debye method,powder diffraction and diffractometer method.The simulation model of EDXRD was constructed,and the system was set up based on the simulation.The experiments of monocrystal NaCl and SiO 2 were carried out to measure the crystal structures,and the results showed that the errors were less than 0.3%.The required time of measurement for each sample was only about 1 min.

关 键 词：能量色散 X射线衍射 晶体结构参量 

分 类 号：O434.1[机械工程—光学工程]