一种基于FPGA的多路HD-SDI测试系统  

Multi-channel HD-SDI test system based on FPGA

作　　者：钱宏文 王毅 刘会 Qian Hongwen;Wang Yi;Liu Hui(China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214072,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214072

出　　处：《电子技术应用》2020年第8期121-125,共5页Application of Electronic Technique

摘　　要：针对目前工业现场HD-SDI测试环境搭建复杂、成本高、SDI传输特性测量难度大的特点和需求,设计和开发了一种基于FPGA的多路HD-SDI测试系统。首先通过FPGA读取存储在SD卡中的图像数据,然后将读取的数据缓存在DDR3中,最后通过FPGA解析和处理后发送给外部的SDI串化器和SDI线缆驱动器,完成多路HD-SDI标准图像的输出。实验结果表明,该测试系统满足HD-SDI传输协议的标准和要求,可用于模拟不同场景下的测试环境和标定现场,并且还具有操作简单、适用性广的优点。Aiming at the problems in the present industrial field HD-SDI test such as the test environment building complex,high cost,SDI transmission characteristics measurement is difficult,this paper designs and develops a multi-channel HD-SDI test system based on FPGA.Firstly,the image data stored in SD card is read through FPGA,and then the data is cached in DDR3.Finally,it is sent to external SDI serializer and SDI cable driver after FPGA analysis and processing,so as to achieve the output of multi-channel HD-SDI standard image.The experimental results show that the test system meets the standard and requirements of HD-SDI transmission protocol,and can be used to simulate the test environment and calibration site in different scenarios,and has the advantages of simple operation and wide practicality.

关 键 词：高清数字接口(HD-SDI) DDR3 串化器 线缆驱动器 

分 类 号：TN402[电子电信—微电子学与固体电子学]