X射线光电子能谱测定元素化学态的常见问题探讨  

Discussion on Common Problems in Determination of Chemistry States of Elements by X-ray Photoelectron Spectroscopy(XPS)

作　　者：丁小艳 武晓 娄金分 曾淦宁[2] 艾宁[2] DING Xiao-yan;WU Xiao;LOU Jin-fen;ZENG Gan-ning;AI Ning(Guizhou Material Industrial Technology Institute,Guizhou Guiyang 550022;College of Chemical Engineering,Zhejiang University of Technology,Zhejiang Hangzhou 310014,China)

机构地区：[1]贵州省材料产业技术研究院,贵州贵阳550022 [2]浙江工业大学化学工程学院,浙江杭州310014

出　　处：《广州化工》2020年第16期85-87,共3页GuangZhou Chemical Industry

基　　金：黔科合基础(2018)1089号;黔科合平台人才项目[(2018)5715]。

摘　　要：X射线光电子能谱(XPS)是一种表面灵敏的定量谱学技术,可以用于分析材料中存在的元素(除氢、氦)构成以及元素的化学态和电子态,是研究原子、分子及固体材料的一种有力工具。XPS在分峰拟合过程中,半峰宽、峰面积、峰间距以及已有的实验结果的归纳均会影响分峰结果的准确性。以一种新型复合材料-纳米零价铁活性炭(NZVI/AC)为例,通过XPS分析其去除水中Cr(Ⅵ)过程中材料表面的元素价态变化,探讨分峰过程中常见的错误对实验结果造成的影响。X-ray photoelectron spectroscopy(XPS)is a surface-sensitive quantitative spectroscopy technique that can be used to analyze the composition of elements(excluding hydrogen and helium)present in materials and the chemical and electronic states of elements.It is a powerful tool for studying atoms,molecules and solid materials.The effects of XPS peak-differentiation-imitating analysis on the chemical state of Nanoscale Zero-Valent Iron/Activated Carbon(NZVI/AC)were studied.The results revealed that the accuracy of XPS-peak-differentiation analysis was always affected by half-peak width,peak area,peak separation and corresponding experimental results.

关 键 词：X射线光电子能谱(XPS) 分峰 化学价态 

分 类 号：O657.3[理学—分析化学]