伪随机测试激励信号设计  

作　　者：孙永建 秦鹏 唐景华 

机构地区：[1]陆军特种作战学院,广西桂林541000

出　　处：《数码设计》2020年第7期76-77,共2页Peak Data Science

摘　　要：模数混合电路的内建自测试(BIST)研究是近些年比较有挑战的,其中如何以较小的硬件开销获得模拟激励信号以及数据响应分析比较关键。本文将以伪随机信号作为研究对象,对BIST结构的激励模块进行设计伪随机信号,并在QuartusⅡ里进行仿真验证,为后续混合信号BIST结构设计打下基础。The study of modular hybrid circuit built-in self-testing(BIST)is challenging in recent years,among which how to obtain analog excitation signal and data response analysis with less hardware cost is key.This article will take the pseudo random signal as the research object,the incentive of BIST structure module design pseudo random signal,and QuartusⅡsimulation verification,lay the foundation for subsequent mixed-signal BIST structure design.

关 键 词：BIST 测试激励 LFSR 

分 类 号：TN407[电子电信—微电子学与固体电子学]