RF多功能芯片on-wafer评估系统的研究  

Development of on-wafer Evaluation System for Multi-function MMIC

作　　者：黄成 文忠锋[1] 顾世玲 HUANG Cheng;WEN Zhong-feng;GU Shi-ling(The 24^th Institute of China Electronic Technology Group Corporation,Chongqing 400060)

机构地区：[1]中国电子科技集团公司第二十四研究所,重庆400060

出　　处：《环境技术》2020年第4期17-20,共4页Environmental Technology

摘　　要：评估RF多功能芯片在不同环境温度下的性能指标是十分重要的,从分析射频多功能芯片功能和主要性能指标出发,研制了一款自动化芯片在片评估系统。采用上位机进行多种芯片工作状态和设备仪器状态控制,实现了芯片在各种不同工作状态不同温度下的测试数据采集、判断和保存。经实际评估验证,该评估系统能高效高可靠性的完成射频多功能芯片在不同环境温度下的on-wafer级性能评估。Analysised the function and main performance of a multi-functional MMIC,and a on-wafer automatic evaluation system was developed.In this system,the PC was used to control the varied working state of the multi-functional MMIC and instruments,the system can collecting the data under different working conditions,judging the result and store data.The system was used for actual evaluation,and the results demonstrated this system could effectively and reliable accomplish auto evaluation of the multi-functional MMIC.

关 键 词：射频测量 射频多功能芯片 TR组件 芯片评估 自动测试系统 

分 类 号：TN386[电子电信—物理电子学]