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作 者:许伟达 潘潇雨 刘伟 许砾 Xu Weida;Pan Xiaoyu;Liu Wei;Xu Li(Shanghai Precision Measurement and Test Instititue,Shanghai 201109,China)
出 处:《国外电子测量技术》2020年第7期104-109,共6页Foreign Electronic Measurement Technology
摘 要:为了保障航天设备的可靠性,对TI公司MPD23774型抗辐照同步电压控制器进行可靠性筛选测试,在测试开发过程中样品器件被损坏后,进行了器件被击穿的机理分析,并针对大电流器件测试过程中如何避免毛刺问题,设计了先到安全电压再步进到设定值及设置电压源信号小带宽和避免热切换手段,结果器件在加电过程中的毛刺问题从原来超过7.8V下降到器件能承受的最大电压7V范围内,结果表明这种大电流器件测试方法有效及有用,并利用此方法解决了此器件的测试筛选。In order to ensure the reliability of aerospace equipment,it is necessary to conduct reliability test on MPD23774 anti irradiation synchronous voltage controller devices made by TI company.The reason of sample damage in the reliability screening test of MPD23774 is studied,and the breakdown mechanism of the device is analyzed.For large current device testing how to avoid burr problem,a method is designed to force voltage to safe value,then to set worth step by step,and set voltage sourcing signal to small bandwidth and avoid hot switch method,make the burr in charging from the original more than 7.8 Vdown to the device can withstand the maximum voltage of 7 V.The result show that this method is effective and useful,and it can solve the problem that may cause the damage of this kind of device in the process of testing and screening.
分 类 号:TN46[电子电信—微电子学与固体电子学]
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