剂量增强效应的蒙特卡罗模拟及实验研究  

Monte Carlo Simulation of Dose Enhancement Effect and Experiment Research

作　　者：吴正新[1,2] 孙慧斌[1,2] 何承发[3] 赵海歌[1] 刘国卿[1] 童永彭[1] 马玉刚[2] 王莹 WU Zheng-xin;SUN Hui-bin;HE Cheng-fa;ZHAO Hai-ge;LIU Guo-qing;TONG Yong-peng;MA Yu-gang;WANG Ying(Institute of nuclear technology,Shenzheng University,Shenzheng Guangdong 518061,China;College of physics,Jilin University,Changchun 130012,China;Xinjiang technical institute of Physics and Chemistry,Urumqi 830011,China;University of Paris-Sud(Paris 11),Institut de Physique Nucleaire,Paris 91405,France)

机构地区：[1]深圳大学核技术研究所,广东深圳518061 [2]吉林大学物理学院,长春130012 [3]中国科学院新疆理化技术研究所,乌鲁木齐830011 [4]巴黎第十一大学核物理研究所,巴黎91405

出　　处：《核电子学与探测技术》2020年第1期94-98,共5页Nuclear Electronics & Detection Technology

基　　金：国家重点研发计划(2017YFF0106500);国家自然科学基金(11575118);载人航天预研项目(010501);深圳市基础科学基金(JCYJ20170818100556755)。

摘　　要：当X射线入射不同材料组成的界面时,在低Z材料的一侧将产生剂量增强,介绍了剂量增强效应的基本原理,并采用MCNP5构建三维铅铝屏蔽盒模型,计算了不同能量的X射线透过铅与铝产生的次级电子能谱以及穿过屏蔽盒后的金硅界面剂量深度分布.模拟计算表明,能量低于300 keV的X射线穿过铅铝屏蔽盒后的次级电子通量明显降低,剂量增强效应几乎可以忽略,界面硅一侧剂量均匀分布,并且实验结果与计算结果几乎吻合.The dose would be enhanced in low Z material when X-ray enters the interface which is constructed with different materials.The mechanic of dose enhancement is introduced in this article.The lead-aluminum shielding box model was constructed by Monte Carlo program mcnp5.The secondary electron energy spectrum generated by X-rays of different energies through lead and aluminum and the depth distribution of the gold-silicon interface after passing through the shielding box were calculated.The simulation results show that:The secondary electron flux of the X-rays below 300 keV after passing through the lead-aluminum shielding box is significantly reduced,the dose-enhancing effect is almost negligible,the dose on the interface Si side of the interface is uniformly distributed,and the experimental results are almost in agreement with the calculated results.

关 键 词：MC模拟 铅铝屏蔽盒 次级电子能谱 剂量增强 

分 类 号：TL99[核科学技术—核技术及应用]