基于可编程芯片的数字电路测试技术  

Digital Circuit Testing Technology Based on Programmable Chip

作　　者：何海[1] 沈英[1,2] 王琦龙 HE Hai;SHEN Ying;WANG Qilong(Nanjing Research Institute of Electronic Technology,Nanjing Jiangsu 210013,China;School of Electronic Science&Engineering,Southeast University,Nanjing Jiangsu 210096,China)

机构地区：[1]南京电子技术研究所,江苏南京210013 [2]东南大学电子科学与工程学院,江苏南京210096

出　　处：《电子器件》2020年第4期888-893,共6页Chinese Journal of Electron Devices

摘　　要：介绍了一种利用被测数字电路中可编程微处理器芯片、大规模可编程FPGA芯片可编程芯片来参与测试的方法。通过对被测数字电路中可编程芯片进行测试软件重构来完成测试性电路构建。在测试计算机控制下,向被测电路加载测试向量。测试软件控制被测电路中的微处理器、FPGA提供各种节点测试响应信号,最终在测试计算机中完成信号的比对及故障识别与辅助定位。经过验证实验,证明该方法具有实用性强、测试成本低的优点。A method of taking part in the test is instruduced by using the programmable chips such as microprocessor chip,large-scale programmable FPGA chip in the tested digital circuit.The test circuit is constructed by reconstructing the test software of the programmable chip in the digital circuit under test.Under the control of the test computer,the test vector is loaded to the digital circuit under test.The test software controls the microprocessor and FPGA in the tested digital circuit to provide various test response signals of nodes.Finally,the signal comparison,fault identification and auxiliary positioning are completed in the test computer.The verification experiment has been carried out.It proves that this method has the advantages of strong practicability and low test cost.

关 键 词：故障诊断 故障隔离定位 测试软件重构 FPGA 

分 类 号：TP306.3[自动化与计算机技术—计算机系统结构]