基于PIN光电二极管的毫米级物体速度测量系统设计  

Design of milimeter scale object velocity measurement system based on PIN photodiode

作　　者：邓峰 巨新浪 Deng Feng;Ju Xinlang(Wuhan Vocational College of Software&Engineering,Wuhan Hubei,430205)

机构地区：[1]武汉软件工程职业学院,湖北武汉430205

出　　处：《电子测试》2020年第18期12-13,共2页Electronic Test

摘　　要：为了满足毫米级物体速度的精确测量,设计了一套利用PIN平面光电二极管阵列构成检测光幕,用以获取微小物体通过检测区间的时间差,并利用单片机自动计算并显示速度的系统。为了减小环境光以及温度对测量结果的影响,本系统采用了AD芯片对环境光进行实时采集,以其转换结果和检测灵敏度补偿量重新设定检测阵列的对比基准,从而避免人为调整的繁琐。In order to meet the accurate measurement of the velocity of millimeter scale object,a system is designed which uses PIN plane photodiode array to form a detection light screen,which can obtain the time of small object passes through the detection range,and use MCU to calculate and display the velocity value automatically.In order to reduce the influence of ambient light on the measurement results,the system uses A/D chips to collect real time ambient light value,and resets the reference of the detection array with conversion results and detection sensitivity compensation,so as to avoid the tedious adjustment.

关 键 词：速度测量 光电检测 抗干扰 

分 类 号：TN312.4[电子电信—物理电子学]