基于光切显微镜的表面粗糙度视觉综合测量方法  

Surface Roughness Visual Comprehensive Measurement Method Based on Light-cut Microscope

作　　者：尹加杰 金守峰[1] 陈阳 李毅 仝梦圆 高凯 YIN Jiajie;JIN Shoufeng;CHEN Yang;LI Yi;TONG Mengyuan;GAO Kai(School of Mechanical and Electrical Engineering,Xi'an Polytechnic University,Xi'an 710048)

机构地区：[1]西安工程大学机电工程学院,西安710048

出　　处：《舰船电子工程》2020年第7期181-185,共5页Ship Electronic Engineering

基　　金：国家自然科学基金青年项目“食品重金属污染光声光谱检测新技术原理研究”(编号:61701384)资助。

摘　　要：针对光切显微镜不能综合测量粗糙度的高度参数和间距参数的问题,提出了基于光切显微镜的视觉测量表面粗糙度方法。通过安装在光切显微镜上的工业相机获取表面粗糙度图像,对图像进行预处理来提高图像对比度,采用最大类间方差法融合形态学算法提取表面粗糙度的光带区域。根据光带区域上下边缘轮廓具有相同的峰谷特点,采用Freeman链码算法提取下边缘轮廓特征,结合边缘轮廓特征以最小二乘法拟合中线,建立了评定表面粗糙度的高度参数和间距参数的数学模型。实验结果表明,该方法测量的高度参数与光切显微镜读数最大相对误差为4.81%,同时实现了间距参数的测量,相对误差控制在4.47%,能够综合评定表面粗糙度。Aiming at the problem that the light-cutting microscope can not comprehensively measure the height parameter and the spacing parameter of roughness,this paper proposes a method for visual measurement of surface roughness based on light-cutting microscope. The surface roughness image is obtained by an industrial camera mounted on a light-cut microscope,and the image is pre-processed to improve the image contrast. The maximum inter-class variance method is used to fuse the morphological algorithm to extract the light-band region of the surface roughness. According to the characteristics of the upper and lower edges of the strip zone,the Freeman chain code algorithm is used to extract the lower edge contour features,and the edge contour features are combined to fit the center line by least squares method. The height parameters and spacing parameters of the surface roughness are established. mathematical model.The experimental results show that the maximum relative error between the height parameter and the light-cutting microscope reading is 4.81%,and the measurement of the spacing parameter is realized. The relative error is controlled at 4.47%,which can comprehensively evaluate the surface roughness.

关 键 词：光切显微镜 机器视觉 表面粗糙度 高度参数 间距参数 最小二乘中线 

分 类 号：TN247[电子电信—物理电子学]