DDS中子效应测试系统  

DDS Neutron Effects Testing System

作　　者：王佳琪 张涛[1] 任凤霞 王成皓 Wang Jia-qi;Zhang Tao;Ren Feng-xia;Wang Cheng-hao(China Electronics Technology Group Corporation NO.58 Research Institute,Jiangsu Wuxi 214000)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214000

出　　处：《电子质量》2020年第9期88-90,94,共4页Electronics Quality

摘　　要：鉴于国内外DDS中子测试系统研究甚少,采用FPGA器件搭建了针对DDS中子辐射测试的远程实时动态监测系统。针对高频时钟远距离衰减问题,提出低频时钟远距传输,配置电路板中继倍频的解决方案,同时搭建了大范围大电流快速响应的电流监测模块,配合上位机可远距离实时监控功耗电流,针对不同功能模块使用不同的线缆连接方式。最后按照测试流程对设计的DDS芯片测试,验证了该测试平台的有效性。In view of the lack of research on DDS neutron testing system at home and abroad,a remote realtime dynamic monitoring system for DDS neutron radiation testing was built by FPGA.According to high frequency clock distance attenuation problem,put forward the low frequency clock distance transmission,the configuration of PCB relay frequency doubling solution,at the same time set up a wide range of large current rapid response to the current monitoring module,cooperate with the upper machine can be remote real-time monitoring of current,power consumption for different function module using a different cable connection.Finally,the DDS chip is tested according to the test procedure,and the validity of the test platform is verified.

关 键 词：DDS 中子测试 远程监测 实时监控 传输线缆 时钟衰减 中继倍频 功耗电流 

分 类 号：TN406[电子电信—微电子学与固体电子学]