激光辐照HgCdTe探测器输出特性与软损伤判定  

HgCdTe Detector Output Characteristics and Soft Damage Determination under Laser Irradiation

作　　者：范永杰[1] 秦强[2] FAN Yongjie;QIN Qiang(School of Science,Kunming University of Science and Technology,Kunming 650500,China;Kunming Institute of Physics,Kunming 650223,China)

机构地区：[1]昆明理工大学理学院,云南昆明650500 [2]昆明物理研究所,云南昆明650223

出　　处：《红外技术》2020年第9期829-832,共4页Infrared Technology

摘　　要：根据PV探测器的开路输出公式,建立了涵盖长波、中波、短波的HgCdTe探测器响应模型。模型仿真发现探测器被激光辐照后产生的温升将降低探测器的输出,探测器被激光直接照射后会立即产生饱和输出。综合实际应用提出了探测器软损伤的判断门限。Based on the open-circuit output function of a photovoltaic(PV)detector,the response model of a HgCdTe detector that is operable in the long-wave,medium-wave,and short-wave bands is established.Simulation results show that the temperature rise generated by laser irradiation reduces the output of the detector,and the detector produces a saturated output immediately upon direct irradiation by the laser.Based on practical applications,the threshold of soft damage to the detector is proposed.

关 键 词：HGCDTE 红外探测器 激光器 软损伤 激光辐照 

分 类 号：TN215[电子电信—物理电子学]