电子设备抗强射频干扰门限确定方法研究  

Determination Method of Immunity Limit of Electronic Device to High RF Interference

作　　者：谢大刚 阮鹏 陈旗 Xie Dagang;Ruan Peng;Chen Qi

机构地区：[1]广州广电计量检测股份有限公司

出　　处：《安全与电磁兼容》2020年第4期48-51,共4页Safety & EMC

摘　　要：提出了一种电子设备抗强射频干扰门限的确定方法,并设计了电磁干扰路径中前/后门耦合的验证实验,建立了设备性能参量与电磁环境的关系式,进而由设备性能要求门限确定强射频电磁环境中电子设备的抗干扰门限,证明了该方法的有效性和正确性。降低了试验室电磁环境模拟的要求,可为GJB 1389A-2005中电子设备敏感机理以及环境限值意义等的研究提供借鉴。This paper presents a method to determine the limit of electronic equipment against strong radio frequency interference,and designs the verification experiment of front / back coupling in EMI path,and then develop the relationship between the electromagnetic environment(EME) and certain physical quantity for performance of device.Thus we can obtain the anti-interference threshold of electronic equipment in strong RF EME by use of the performance limit of the device,which proves the effectiveness and correctness of the method.The requirements of electromagnetic environment simulation in laboratory are reduced,which can provide reference for the research of electronic equipment sensitive mechanism and environmental limit value in GJB 1389A-2005.

关 键 词：抗干扰门限 强射频电磁环境 敏感性 电子设备 

分 类 号：TN03[电子电信—物理电子学]