Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy  

作　　者：Li-Jun Xu Peng-Fei Zhai Sheng-Xia Zhang Jian Zeng Pei-Pei Hu Zong-Zhen Li Li Liu You-Mei Sun Jie Liu 徐丽君;翟鹏飞;张胜霞;曾健;胡培培;李宗臻;刘丽;孙友梅;刘杰(Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China;School of Nuclear Science and Technology,University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China [2]School of Nuclear Science and Technology,University of Chinese Academy of Sciences,Beijing 100049,China

出　　处：《Chinese Physics B》2020年第10期401-405,共5页中国物理B（英文版）

基　　金：Project supported by the National Natural Science Foundation of China (Grant Nos. 11675233,11690041,11405229,11705246,and 11505243);Chinese Academy of Sciences “Light of West China” Program;the Youth Innovation Promotion Association of Chinese Academy of Sciences (Grant No. 2020412)。

摘　　要：The various morphologies of tracks in MoS2 irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u 86Kr, 129Xe, 181Ta, and 209Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS2 is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS2. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.

关 键 词：ion track MOS2 transmission electron microscopy(TEM) RECRYSTALLIZATION 

分 类 号：O571.6[理学—粒子物理与原子核物理]