Pr^3+掺杂Ge-Ga-Se-CsI硫卤玻璃性能及光纤制备  

Pr^3+Doped Ge-Ga-Se-CsI Chalcohalide Glass and Fiber Preparation

作　　者：汪俊 冯赞 吴国林 汪金晶 焦凯 王弦歌 刘佳 梁晓林 徐铁松 钟明辉 肖晶 赵浙明[3] 刘自军[1,2] 刘永兴 王训四[1,2] WANG Jun;FENG Zan;WU Guo-lin;WANG Jin-jing;JIAO Kai;WANG Xian-ge;LIU Jia;LIANG Xiao-lin;XU Tie-song;ZHONG Ming-hui;XIAO-Jing;ZHAO Zhe-ming;LIU Zi-jun;LIU Yong-xing;WANG Xun-si(Laboratory of Infrared Materials and Devices,Research Institute of Advanced Technology,College of Information,Ningbo University,Ningbo 315211,China;Key Laboratory of Photoelectric Detection Materials and Devices of Zhejiang Province,Ningbo 315211,China;Nanhu College,Jiaxing University,Jiaxing 314001,China)

机构地区：[1]宁波大学信息科学与工程学院高等技术研究院红外材料及器件实验室,浙江宁波315211 [2]浙江省光电探测材料及器件重点实验室,浙江宁波315211 [3]嘉兴学院南湖学院,浙江嘉兴314001

出　　处：《发光学报》2020年第11期1343-1350,共8页Chinese Journal of Luminescence

基　　金：国家自然科学基金(61705091,61875097,61627815);浙江省自然科学基金(LY20F050010,LR18F050002)资助项目。

摘　　要：采用熔融淬冷法制备了两种浓度的Pr^3+掺杂GeSe2-Ga2Se3-CsI(GGC)硫卤玻璃。在2.0μm激光激励下,比较了玻璃片(2 mm)和玻璃柱(6 mm)的荧光发射光谱。用Judd-Ofelt理论计算分析了Pr^3+掺杂Ge-Ga-Se-CsI硫卤玻璃的强度参数Ωi(i=2,4,6)和辐射寿命τrad等光谱参数。通过拟合衰变曲线,测得了玻璃的荧光寿命值(0.5%Pr^3+:3.08 ms)。所制备的光纤具备双包层结构,通过截断法得到光纤在7.6μm处的最低损耗为2.27 dB/cm。Different series of Pr^3+doped GeSe2-Ga2Se3-CsI(GGC)chalcogenide glass were prepared by a melt-quenching method.Under the excitation of 2.0μm wavelength,the emission spectra of bulk glass(2 mm)and glass column(6 mm)were compared.The intensity parameterΩi(i=2,4,6)and radiative lifetimeτrad of Pr 3+doped Ge-Ga-Se-CsI chalcogenide glass are calculated and analyzed by Judd-Ofelt theory.The fluorescence lifetime of the glass(0.5%Pr^3+:3.08 ms)was measured by fitting the decay curve.The fabricated fiber has a double cladding structure,the fiber loss is measured by cut-back method and the minimum loss at 7.6μm is 2.27 dB/cm.

关 键 词：硫卤玻璃 JUDD-OFELT理论 辐射寿命 光纤损耗 

分 类 号：TN29[电子电信—物理电子学]