运算放大器压摆率测量系统设计  被引量:1

Design of Slew Rate Measurement System of Operational Amplifier

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作  者:赵二刚[1] 张维[1] ZHAO Er-gang;ZHANG Wei(College of Electronic Information and Optical Engineering,Nankai University,Tianjin 300350,China)

机构地区:[1]南开大学电子信息与光学工程学院,天津300350

出  处:《自动化与仪表》2020年第11期49-52,共4页Automation & Instrumentation

基  金:南开大学自制实验教学仪器设备项目(20NKZZYQ10)。

摘  要:压摆率是运算放大器的重要参数之一,该文设计了一种运算放大器压摆率测量系统。将被测运算放大器连接成电压跟随器的形式,以嵌入式处理器和可编程逻辑器件为核心控制单元产生方波激励信号,并测量运算放大器输出信号的峰-峰值;结合压摆率的定义,进而得到被测运算放大器的压摆率,同时利用液晶屏显示幅频特性曲线。试验结果与芯片器件手册提供的参数及利用示波器按照压摆率的定义测得的结果基本一致;实测结果表明该系统运行稳定,可以实现对μA741运算放大器压摆率的测量。Slew rate is one of the important parameters of operational amplifier.A slew rate measurement system of operational amplifierμA741 is designed.The tested operational amplifier is connected as a voltage follower.The embedded processor and programmable logic device are used as the core control unit to generate square wave excitation signal,and the peak-to-peak value of the operational amplifier output is measured.According to the definition of slew rate,the slew rate of the tested operational amplifier is calculated,and the curve of amplitude-frequency characteristics is also displayed on the LCD screen.The test results are basically consistent with the parameters provided by the datasheet and the oscilloscope measurement results defined by slew rate.The actual measurement results show that the system runs stably and can measure the slew rate ofμA741 operational amplifier.

关 键 词:压摆率测量系统 μA741运算放大器 幅频特性曲线 

分 类 号:TP342.1[自动化与计算机技术—计算机系统结构]

 

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