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作 者:罗华明 LUO Huaming
机构地区:[1]大北欧通讯设备(中国)有限公司全球研发部,福建厦门361006
出 处:《科技创新与应用》2020年第36期22-24,共3页Technology Innovation and Application
摘 要:随着市场竞争的发展,人们对头戴式耳机的性能、可靠性和成本有越来越强的要求。耳机头带设计的潜在失效模式和影响分析(FMEA)让设计师能够对系统进行定性分析,以便识别关键特性。夹紧力不当和头带疲劳失效是其中的两个主要的失效模式。这两个失效模式是由两个设计因子主导的:金属头带的厚度和抗拉强度。有限元分析(FEA)用于评估设计响应,即头带疲劳寿命和夹紧力。这些响应与优化模块相结合,呈现出有助于确定最佳金属带厚度和抗拉强度的解决方案,同时保持头带的性能指标;成本和可靠性。本研究旨在开发能够整合设计问题的识别、失效模式影响和分析、疲劳失效分析和头带设计优化于一体的设计方法学。With the development of market competition,people have more and more requirements on the performance,reliability and cost of headphones.The potential failure mode and effect analysis(FMEA)of headband design enables designers to conduct qualitative analysis of the system in order to identify key characteristics.Improper clamping force and fatigue failure of headband are the two main failure modes.These two failure modes are dominated by two design factors:thickness and tensile strength of metal headband.Finite element analysis(FEA)is used to evaluate the design response,i.e.,the fatigue life and clamping force of the headband.These responses,combined with the optimization module,present solutions that help determine the optimal strip thickness and tensile strength while maintaining the performance indicators of the headband;cost and reliability.The purpose of this study is to develop a design methodology that integrates design problem identification,FMEA,fatigue failure analysis and headband design optimization.
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