基于边界扫描的远程可测性设计技术研究  

Remote Testability Design Technology based on Boundary Scan

作　　者：张昊[1] 周哲帅 ZHANG Hao;ZHOU Zhe-shuai(Southwest Institute of Electronic Technology,Chengdu Sichuan 610000,China;Unit 32011 of PLA,Beijing 100085,China)

机构地区：[1]西南电子技术研究所,四川成都610000 [2]中国人民解放军32011部队,北京100085

出　　处：《通信技术》2020年第11期2872-2877,共6页Communications Technology

摘　　要：随着大规模数字电路系统复杂度的不断提高,系统内部芯片与芯片之间互联故障测试性越来越重要。基于边界扫描的可测性(Design For Test,DFT)设计技术是提高大规模数字电路系统测试性的一种重要手段,但传统的可测性设计方法需要将测试设备通过测试总线连接到待测系统上。然而,测试总线的长度总是有限的,限定了该技术的应用场合。针对该问题,在已有研究基础上,对DFT设计技术进行改进,提出了一种远程可测性设计技术(Remote Design For Test,RDFT),实现了大规模数字电路系统的远程一键式互连故障诊断,进一步降低了测试复杂度。With the continuous improvement of the complexity of large scale digital circuit systems,the testability of interconnect faults between chips within the system is becoming more and more important.The Design For Test(DFT)technology based on boundary scan is an important means to improve the testability of large scale digital systems,but the traditional DFT method needs to connect test equipment to the system under test through a test bus.However,the length of the test bus always limited,which limits the application of this technology.In response to this problem,and on the basis of existing research,the DFT design technology is improved and a remote testability design technology is proposed,which realizes the remote one-key interconnection fault diagnosis of large scale digital circuit systems and further reduces the complexity of testing.

关 键 词：远程可测性 边界扫描 故障诊断 大规模数字电路 

分 类 号：TN407[电子电信—微电子学与固体电子学]