专利引文追踪检索在专利分析中的应用  

Application of Patent Citation Tracking and Searching in Patent Analysis

作　　者：张超[1] 刘洛[1] ZHANG Chao;LIU Luo(Patent Examination Cooperation Sichuan Center of the Patent Office,CNIPA,Chengdu 610213)

机构地区：[1]国家知识产权局专利局专利审查协作四川中心,成都610213

出　　处：《中国发明与专利》2020年第S02期147-152,共6页China Invention & Patent

摘　　要：本文重点探索专利引文追踪检索方法在专利分析中的应用。根据不同专利数据库中专利引文数据组织方式,选取毫米波成像技术领域早期专利为基础,通过专利引文追踪检索方式挖掘毫米波成像技术领域重要专利。结合专利引证数据分析毫米波成像技术的热点研究方向以及技术发展历程。结果表明,专利引文追踪检索在专利分析中的重要专利技术挖掘和专利技术演进方面具有较好适用性。This paper focuses on the application of patent citation tracking and searching methods in patent analysis.According to the organization mode of patent citation data in different patent databases,the early patents in the field of millimeter wave imaging technology are selected as the basis,and the important patents in the field of millimeter wave imaging technology are mined through the patent citation tracking and searching method.Combining patent citation data to analyze the hot research directions and technological development process of millimeter wave imaging technology.The results show that the patent citation tracking and searching method has good applicability in the important patent technology mining and patent technology evolution in patent analysis.

关 键 词：专利引文 追踪检索 毫米波成像 专利分析 

分 类 号：G306[文化科学]