警惕翻新IC器件,把好装备QC源头  

Be alert to renovate IC devices,Control the source of QC equipment

作　　者：张利锋 郝沛沛 齐俊东 张星强 Zhang Lifeng;Hao Peipei;Qi Jundong;Zhang Xingqiang(Military Representative Office of military representative Bureau of equipment development department of Central Military Commission in Tianjin,Tianjin,300462)

机构地区：[1]中央军委装备发展部军事代表局驻天津地区军事代表室,天津300462

出　　处：《电子测试》2020年第22期92-95,共4页Electronic Test

摘　　要：当前,翻新IC器件导致的装备质量问题屡见不鲜,已成为藏身于装备之中的“定时炸弹”。本文从翻新IC器件的质量隐患入手,指出其存在的巨大危害;从供需双方角度的客观分析入手,揭示了现实存在的灰色产业链条;从固有的特征表象入手,提出了简单经济的“五看法”鉴别模式;从制度预防的层面入手,提出了适合装备生产特点和管理要求的防范措施。At present,the equipment quality problems caused by the renovation of IC devices are common,which has become a“time bomb”hidden in the equipment.This paper starts with the quality hidden danger of refurbished IC devices and points out its great harm.Starting from the objective analysis of the supply and demand sides,it reveals the existing gray industrial chain.Starting from the inherent characteristics,it puts forward a simple and economic“five views”identification mode.From the perspective of system prevention,it puts forward the prevention suitable for the characteristics of equipment production and management requirements measures.

关 键 词：翻新IC器件鉴别 防范 

分 类 号：TN40[电子电信—微电子学与固体电子学]