两种可靠性加速测试方法及失效率评估与预测  

Two Reliability Accelerated Testing Methods and Evaluation and Prediction of Failure Rate

作　　者：雷春霞 Lei Chun-xia(Signify luminaire(Shang Hai)Ltd.Company,Shanghai 200233)

机构地区：[1]昕诺飞灯具(上海)有限公司,上海200233

出　　处：《电子质量》2020年第11期44-47,共4页Electronics Quality

摘　　要：可靠性测试项目种类有很多,如何选择,用较少的样品数及较少的测试时间来最大化的发现产品的失效率和失效模式,从而进一步提高产品的可靠性,这个是电子行业内普遍比较感兴趣的课题。该文结合笔者多年在电子产品领域的研发设计和可靠性工作经验,推荐两种可靠性加速测试方法:双85测试和高低温冲击测试,并重点介绍了两种测试方法的加速因子计算;同时介绍了一种用卡方分布来推测产品失效率的计算方法,最后该文根据一个实际电子产品的案例,给出如何根据产品的预期失效率设计双85测试的测试时间和测试样品数,以及如何根据产品的预期使用寿命内总开关次数设计高低温冲击测试的测试条件和测试循环数。There are many types of reliability test items.How to choose to use less sample size and less test time to maximize find the failure rate and failure mode of the product,so as to further improve the reliability of the product.This topic is the one electronics industry general interested in.Based on the author's years of experience in R&D and reliability in the field of electronic products,this article recommends two reliability accelerated test methods:Wet High temperature operating test(double 85 test)and thermal shock test,and focuses on the acceleration factor calculation of the two test methods;Presents a calculation method of prediction the failure rate of a product by using the chi-square distribution.Finally,based on an actual electronic product,this article shows how to design the test time and the number of test samples for the double 85 test according to the expected failure rate of the product,and how to design the test conditions and the number of test cycles of thermal shock test according to the products service life.

关 键 词：可靠性加速测试 双85测试 高低温冲击测试 加速因子 卡方分布 失效率 平均失效时间(MTTF) 使用寿命 

分 类 号：TN406[电子电信—微电子学与固体电子学]