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作 者:吴梅[1] 章然 章群丹[1] 刘小东 Wu Mei;Zhang Ran;Zhang Qundan;Liu Xiaodong(SINOPEC Research Institute of Petroleum Processing,Beijing 100083;Ancoren Technology Co.Ltd.)
机构地区:[1]中国石化石油化工科学研究院,北京100083 [2]安科慧生科技有限公司
出 处:《石油炼制与化工》2020年第12期96-101,共6页Petroleum Processing and Petrochemicals
基 金:国家重点研发计划项目(2019YFC1906305)。
摘 要:利用能量色散X射线荧光光谱仪建立了轻质油品中有害杂质硅、磷、硫、氯4种元素含量的快速测定方法。对X射线光源靶材、测定参数、基质效应以及测试过程的影响因素进行考察及优化,并采用标准加入法对测定方法的有效性进行验证。结果表明:采用所建立的方法测定硅、磷、硫、氯含量的结果均具有良好的线性关系,R2大于0.999;硅、磷、硫、氯最低检出限分别为2.0,0.8,0.5,0.2μg g;加标回收率在95.1%~105.0%之间;相对标准偏差均小于6%。该方法可以用于轻质油品中有害杂质元素的快速测定与筛查。A rapid accurate method for determination of trace pollutants in light petroleum products,including silicon,phosphorus,sulfur and chlorine-containing compounds,was established by using ED-XRF.The target material of X-ray source,matrix effect and the interfering factors for the measurement process were investigated and optimized.The validation was carried out by the standard addition.The results showed that the established method had a good linear relationship with silicon,phosphorus,sulfur,chlorine content with R 2 more than 0.999.The detection limits of silicon,phosphorus,sulfur and chlorine were 2.0,0.8,0.5,0.2μg g,respectively.The adding standard recoveries were between 95.1%-105.0%,the relative standard deviation was less than 6.0%.It could be used for rapid determination and screening of harmful impurities in light petroleum products.
关 键 词:能量色散X射线荧光光谱 微量元素 有害杂质 轻质油品
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