红外探测器IWR读出模式在搜索系统中残影现象分析  

Analysis of the afterimage phenomenon of infrared detector IWR read-out mode in search system

作　　者：杨耿 王超[2] 刘纪洲[2] YANG Geng;WANG Chao;LIU Jiu-zhou(32381 Unit of PLA,Beijing 100071,China;North China Research Institute of Electro-Optics,Beijing 100015,China)

机构地区：[1]32381部队,北京100071 [2]华北光电技术研究所,北京100015

出　　处：《激光与红外》2020年第11期1364-1369,共6页Laser & Infrared

摘　　要：在研究搜索系统中红外探测器IWR读出模式对相邻帧成像的影响时发现,选择IWR读出模式后,热像仪对强辐射目标成像,会产生残影现象,出现白影和黑影。针对此问题,本文进行了大量的理论与实验分析,解释了残影现象出现的原因,通过对残影现象进行建模,推导出了寄生电容的公式,并验证了公式的合理性。通过实验分析出残影强度主要与目标和背景温度差有关,温度差越大,残影现象越明显。最后分析了残影现象对搜索系统产生的影响,并提出了减弱残影强度的途径。In study of the influence of the infrared detector IWR readout mode in the search system on the imaging of adjacent frames,it is found that,in the IWR readout mode,when the thermal imager images the strong radiation target,the residual image phenomenon,the white and black shadows will appear.To solve this problem,this paper has carried out a lot of theoretical and experimental analysis to explain the cause of the afterimage phenomenon.By modeling the afterimage phenomenon,the parasitic capacitance formula is deduced,and the rationality of the formula is verified.It is analyzed through experiments that the residual image intensity is mainly related to the temperature difference between the target and the background.The larger the temperature difference,the more obvious the residual image phenomenon.Finally,this paper analyzed the influence of the afterimage phenomenon on the search system,and proposed a way to reduce the intensity of the afterimage.

关 键 词：红外探测器 IWR 残影 搜索系统 

分 类 号：TN215[电子电信—物理电子学]