等离子体破裂期间逃逸电流平台的研究  

Study on Runaway Current Platform During Plasma Disruptions

作　　者：竹锦霞 涂朴 李强 李林芯 ZHU Jinxia;TU Pu;LI Qiang;LI Linxin(School of Intelligent Manufacturing,Sichuan University of Arts and Science,Dazhou Sichuan 635000)

机构地区：[1]四川文理学院智能制造学院,四川达州635000

出　　处：《首都师范大学学报（自然科学版）》2020年第6期20-23,共4页Journal of Capital Normal University：Natural Science Edition

基　　金：四川省教育厅重点科研项目(18ZA0417);四川文理学院创新训练项目(201810644074)。

摘　　要：研究HL-2A装置等离子体破裂期间逃逸电流平台形成特性,利用2种不同的数值模拟方法研究等离子体破裂后逃逸电流平台,拟合结果表明2种方法下逃逸电流平台形成趋势相同.利用诊断系统观察到持续时间为120 ms的电流平台,等离子体破裂期间欧姆电流转化为逃逸电流的转换率高达72%.The characteristics of the formation of the escape current platform during plasma rupture in the HL-2A device were analyzed.Two different numerical simulation methods were used to investigate the runaway current platform after the plasma disruption,and the fitting results showed that the forming trends of runaway current platform were the same.A current platform with a duration of 120 ms was observed by using the diagnostic system,and the conversion rate of Ohmic current to runaway current was as high as 72%.

关 键 词：等离子体破裂 逃逸电子 逃逸电流 

分 类 号：O53[理学—等离子体物理]