Atomic-level characterization of liquid/solid interface  

作　　者：Jiani Hong Ying Jiang 洪嘉妮;江颖(International Center for Quantum Materials,School of Physics,Peking University,Beijing 100871,China;Collaborative Innovation Center of Quantum Matter,Beijing 100871,China;CAS Center for Excellence in Topological Quantum Computation,University of Chinese Academy of Sciences,Beijing 100190,China)

机构地区：[1]International Center for Quantum Materials,School of Physics,Peking University,Beijing 100871,China [2]Collaborative Innovation Center of Quantum Matter,Beijing 100871,China [3]CAS Center for Excellence in Topological Quantum Computation,University of Chinese Academy of Sciences,Beijing 100190,China

出　　处：《Chinese Physics B》2020年第11期25-36,共12页中国物理B（英文版）

摘　　要：The detailed understanding of various underlying processes at liquid/solid interfaces requires the development of interface-sensitive and high-resolution experimental techniques with atomic precision.In this perspective,we review the recent advances in studying the liquid/solid interfaces at atomic level by electrochemical scanning tunneling microscope(EC-STM),non-contact atomic force microscopy(NC-AFM),and surface-sensitive vibrational spectroscopies.Different from the ultrahigh vacuum and cryogenic experiments,these techniques are all operated in situ under ambient condition,making the measurements close to the native state of the liquid/solid interface.In the end,we present some perspectives on emerging techniques,which can defeat the limitation of existing imaging and spectroscopic methods in the characterization of liquid/solid interfaces.

关 键 词：liquid/solid interface atomic scale scanning tunneling microscope(STM) atomic force microscopy(AFM) 

分 类 号：O353.4[理学—流体力学]